Computer Science Colloquium
Dr. Daniel Tille
Infineon, Munich, Germany
Functional Safety - A brief overview from DFT point of viewTue 09.10.2018, 14:00, 60 minutes
JKU, Computer Science Building (Science Park 3), room S3 318
AbstractFunctional Safety is currently a very hot topic in the Automotive semiconductor community. Its fundamental purpose is to develop systems, that work correctly even in the presence of a fault. The international standard ISO 26262 gives instructions how the development of such a safe chip can be accomplished and how functional safety can be validated.
The main goal of this presentation is to give some insights into this important topic. Furthermore, it is discussed how Design-for-Test usually contributes here during the development.
BioDaniel Tille has been with Infineon Technologies in Munich for 6 years. He is DFT Architect for Infineon's automotive microcontroller family AURIX. Additionally, he leads a team of DFT engineers.
From 2010 to 2012 he worked for Daimler in Sindelfingen where he developed new formal automatic test case generation methods.
Daniel Tille holds a Diploma degree in Computer Science from University of Halle and a PhD degree in Engineering from University of Bremen.
Invited by Univ.-Prof. Dr. Robert Wille, Institut für Integrierte Schaltungen, Abteilung Integrierter Schaltungs- und Systementwurf
The Computer Science Colloquium is organized by the Department of Coputer Science at JKU, the Österreichische Gesellschaft für Informatik (ÖGI) and the Österreichische Computergesellschaft (OCG).